| Citation: | XU Hongbin, FAN Jiang, JING Fulei, et al. Simulation of oxide growth in thermal barrier coating based on optimal transport meshless method[J]. Journal of Aerospace Power, 2022, 37（10）：2104-2111 doi: 10.13224/j.cnki.jasp.20220239
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Under the self-developed optimal transport meshless (OTM) framework, a thickness growth algorithm was developed and the anisotropic oxidation growth process of thermal oxide layer (TGO) was simulated. Using this method, the typical transition section of TGO layer was taken as an object to study the change of stress and displacement under thermal cycling load. The simulation results coincided with the test. The results showed that this method can well simulate the wrinkle phenomenon in the process of interface growth. Compared with the finite element method, the deformation of the element was uniform, making it suitable for numerical simulation of the growth process of TGO. The maximum stress of the thermal barrier coating mainly occurred at the convex position, and the lateral change of the convex position had a tendency to aggravate the large deformation of the oxide layer interface.
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