Volume 26 Issue 7
Jul.  2011
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LIU Qi, WANG Nan. Bayesian sequential variance test technique based on posterior probability (Ⅱ)[J]. Journal of Aerospace Power, 2011, 26(7): 1537-1542.
Citation: LIU Qi, WANG Nan. Bayesian sequential variance test technique based on posterior probability (Ⅱ)[J]. Journal of Aerospace Power, 2011, 26(7): 1537-1542.

Bayesian sequential variance test technique based on posterior probability (Ⅱ)

  • Received Date: 2010-07-04
  • Rev Recd Date: 2011-03-24
  • Publish Date: 2011-07-28
  • Under the condition of a given theoretical censored test number,it's needed to gain a theoretical largest censored test number and design the experiment for the benefit of the consumers.Based on posterior probability and "small probability event principle" for protecting the customer's profit,the Bayesian sequential variance test (BSVT) model was modified, modified Bayesian sequential variance test (MBSVT) model was constructed,and the algorithms of solving the continuous test region critical value of sequential test were designed.The calculation method of average sample number (ASN) was also given.With an example,the solution and application of MBSVT model were illustrated.

     

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