Volume 27 Issue 1
Jan.  2012
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FENG Wen-zhe, LIU Qi. Bayesian reliability demonstration test design for binomial distributed product[J]. Journal of Aerospace Power, 2012, 27(1): 110-117.
Citation: FENG Wen-zhe, LIU Qi. Bayesian reliability demonstration test design for binomial distributed product[J]. Journal of Aerospace Power, 2012, 27(1): 110-117.

Bayesian reliability demonstration test design for binomial distributed product

  • Received Date: 2011-03-24
  • Rev Recd Date: 2011-07-18
  • Publish Date: 2012-01-28
  • The requirements and constraint conditions of reliability statistical demonstration test design for binomial distributed product were analyzed.Considering the producer's risk and consumer's risk,reliability test cost,the reliability test design model based on test loss (RTDMTL) was constructed for the reliability test design of binomial distributed product.To given sample size,according to 0-1 loss function,the acceptable maximum failure number calculation method was presented under the principle of minimize the posterior expect loss.According to average risk criteria,the formulas of producer's risk and consumer's risk were deduced.To the solution of RTDMTL,the steps of optimum test plan calculating numeric algorithm were given by Matlab software.At last,an example was given to show the validity of the proposed method.

     

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