Comparison of two reliability models for performance degradation analysis

WANG Zhi-hua; ZANG Guang-kui; ZHANG Yong-bo; FU Hui-min

doi:10.13224/j.cnki.jasp.2015.07.014

Comparison of two reliability models for performance degradation analysis

doi: 10.13224/j.cnki.jasp.2015.07.014

Research Center of Small Sample Technology, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

基金项目:

Beijing Natural Science Foundation (3154034)

National Natural Science Foundation of China (11202011)

National Basic Research Program of China (2012CB720000)

Fundamental Research Funds for the Central Universities (YWK13HK11)

详细信息

中图分类号: V215.7;TB114.3
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出版历程
- 收稿日期: 2014-01-23
- 刊出日期: 2015-07-28

Comparison of two reliability models for performance degradation analysis

Research Center of Small Sample Technology, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

Funds:

Beijing Natural Science Foundation (3154034)

National Natural Science Foundation of China (11202011)

National Basic Research Program of China (2012CB720000)

Fundamental Research Funds for the Central Universities (YWK13HK11)

摘要

摘要: In order to investigate the general reliability assessment methods based on performance degradation data, two commonly used stochastic process approaches, bilinear process method and random-effect model were studied. Analyzing procedure and effectiveness of these two methodologies were studied and compared. Meanwhile, the two approaches were illustrated through practical applications. The residual plots and the 10th percentile curves of the two methods were presented to demonstrate the comparative results. The random-effect model yielded more volatile residuals and a lower and unsafe 10th percentile curve. Consequently the bilinear process model can be concluded to derive more reasonable results due to its one-stage estimation property.
- degradation analysis /
- reliability assessment /
- stochastic process /
- bilinear independent increment process /
- random-effect model
Abstract: In order to investigate the general reliability assessment methods based on performance degradation data, two commonly used stochastic process approaches, bilinear process method and random-effect model were studied. Analyzing procedure and effectiveness of these two methodologies were studied and compared. Meanwhile, the two approaches were illustrated through practical applications. The residual plots and the 10th percentile curves of the two methods were presented to demonstrate the comparative results. The random-effect model yielded more volatile residuals and a lower and unsafe 10th percentile curve. Consequently the bilinear process model can be concluded to derive more reasonable results due to its one-stage estimation property.
- degradation analysis /
- reliability assessment /
- stochastic process /
- bilinear independent increment process /
- random-effect model

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参考文献(19)

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