真实气体效应对等离子体鞘套及电磁参数的影响

李俊红; 吕俊明; 苗文博; 程晓丽

doi:10.13224/j.cnki.jasp.20210124

真实气体效应对等离子体鞘套及电磁参数的影响

doi: 10.13224/j.cnki.jasp.20210124

李俊红^{1, 2},
吕俊明^{1, 2},
苗文博^{1, 2},
程晓丽^{1, 2}

1.
中国航天空气动力技术研究院空气动力理论与应用研究所，北京 100074
2.
中国航天科技集团有限公司航天飞行器气动热防护实验室，北京 100074

基金项目:

装备预先研究项目基金 6140206040215

详细信息

作者简介:
李俊红（1978-），女，高级工程师，博士，主要从事高温真实气体效应和超声速燃烧数值模拟研究。

中图分类号: V411.3
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- 被引次数: 0
出版历程
- 收稿日期: 2021-03-19

Real gas effects on the plasma sheath and the electromagnetic parameters of the reentry vehicle

LI Junhong^{1, 2},
LÜ Junming^{1, 2},
MIAO Wenbo^{1, 2},
CHENG Xiaoli^{1, 2}

1.
Institute of Aerodynamic Theory and Application，China Academy of Aerospace Aerodynamics，Beijing 100074，China
2.
Laboratory of Aero⁃thermal Protection Technology for Aerospace Vehicles，China Aerospace Science and Technology Corporation，Beijing 100074，China

摘要

摘要:
针对高速飞行器高超声速飞行环境，建立了热化学非平衡流动数值模拟技术，并对计算方法的可靠性进行了验证，接着开展了真实气体效应对飞行器等离子体鞘套及其电磁参数的影响规律分析。结果表明：飞行器物面中心线等离子体密度峰值与飞行试验符合良好；对于碰撞频率，沿滞止流线，双温模型以及Park反应模型对等离子体碰撞频率的影响趋势是一致的；对于相对介电常数，除激波附近，流场其他区域的实部接近1，激波附近小于1，虚部沿滞止流线逐渐升高；双温模型以及Park反应模型对相对介电常数实部和虚部的影响趋势是一致的。
- 热化学非平衡 /
- 等离子体鞘套 /
- 真实气体效应 /
- 双温模型 /
- 电磁参数
Abstract:
The numerical simulation technology of thermochemical non⁃equilibrium flow was established for aircraft hypersonic flight environment，the reliability of the calculation method was verified，and the influence law of high temperature real gas effect on plasma sheath and electromagnetic parameters in plasma was analyzed.The results showed:the numerical calculation results of aircraft peak plasma density on wall central line were in agreement with flight test results，as for the collision frequency，along the stagnation line，the two⁃temperature model and the Park reaction model had the same influence trend on the plasma collision frequency；for the relative dielectric constant，near the shock wave，the real part of other areas of the flow field was close to 1，and the imaginary part gradually increased along the stagnation line；The influence trend of the two⁃temperature model and the Park reaction model on the real and imaginary parts of the relative dielectric constant were consistent.
- thermochemical non⁃equilibrium /
- plasma sheath /
- real gas effect /
- two⁃temperature model /
- electromagnetic parameters
注释:

1) 张雪

HTML

图 1 RAM C⁃Ⅱ 模型

Figure 1. RAM C⁃Ⅱ model

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图 2 RAM C⁃Ⅱ 计算网格

Figure 2. Sketch of the RAM C⁃Ⅱ computed grid

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图 3 RAM C⁃Ⅱ 对称面电子密度峰值计算结果与飞行结果的对比

Figure 3. Electron density peak comparison between the computation result and the flight test data along the RAM C⁃Ⅱ symmetry plane

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图 4 RAM C⁃Ⅱ对称面等离子体密度等值线分布（完全催化壁面、单温模型）

Figure 4. Plasma density contour on the RAM C⁃Ⅱ symmetry plane （full catalytic wall condition,one⁃temperature model）

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图 5 热力学模型对RAM C⁃Ⅱ头部滞止线上温度的影响

Figure 5. Effect of thermal models on the head temperature distribution along the RAM C⁃Ⅱ head stagnation line

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图 6 热力学模型对RAM C⁃Ⅱ 头部滞止线上等离子体密度的影响

Figure 6. Effect of thermodynamic models on the plasma density along the RAM C⁃Ⅱ head stagnation line

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图 7 热力学模型对RAM C⁃Ⅱ对称面等离子体峰值密度的影响

Figure 7. Effect of thermodynamic models on the plasma density peak on the RAM C⁃Ⅱ symmetry plane

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图 8 化学反应模型对RAM C⁃Ⅱ头部滞止线上温度的影响

Figure 8. Effect of chemical reaction models on the temperature along the RAM C⁃Ⅱ head stagnation line

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图 9 化学反应模型对RAM C⁃Ⅱ头部滞止线上等离子体密度的影响

Figure 9. Effect of chemical reaction models on the plasma density along the RAM C⁃Ⅱ head stagnation line

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图 10 化学反应组分对RAM C⁃Ⅱ对称面等离子体密度峰值的影响

Figure 10. Effect of chemical reaction species on the plasma density peak on the RAM C⁃Ⅱ symmetry line

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图 11 化学反应模型对RAM C⁃Ⅱ对称面等离子体密度峰值的影响

Figure 11. Effect of chemical reaction models on the plasma density peak on the RAM C⁃Ⅱ symmetry plane

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图 12 RAM C⁃Ⅱ对称面等离子体鞘套碰撞频率等值线分布（完全催化壁面、单温模型）

Figure 12. Collision frequency contour distribution of the plasma sheath on the RAM C⁃Ⅱ symmetry plane （full catalytic wall condition and one⁃temperature model）

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图 13 热力学模型对RAM C⁃Ⅱ头部滞止线上等离子体鞘套碰撞频率的影响

Figure 13. Effect of thermodynamic models on the plasma sheath collision frequency along the RAM C⁃Ⅱ head stagnation line

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图 16 化学反应模型对RAM C⁃Ⅱ头部滞止线上等离子体鞘套碰撞频率的影响

Figure 16. Effect of chemical reaction models on the plasma sheath collision frequency along the RAM C⁃Ⅱ head stagnation line

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